ScanningElectronMicroscopy(SEM)isapowerfulimagingtechniquethatusesafocusedbeamofelectronstogeneratehigh-resolutionimagesofasample'ssurface.Unliketraditionalopticalmicroscopy,SEMprovidesmuchgreatermagnificationanddepthoffield,allowingfordetailedexaminationofmicro-andnano-scalefeatures.Theelectronbeaminteractswiththesample,producingvarioussignalssuchassecondaryelectrons,backscatteredelectrons,andX-rays,whicharecollectedtocreatedetailedtopographicalandcompositionalinformation.SEMiswidelyusedinmaterialsscience,biology,nanotechnology,andindustrialapplicationsforitsabilitytorevealfinesurfacestructuresandelementalcomposition.Itsversatilitymakesitanessentialtoolinbothresearchandqualitycontrol.
